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Understanding Non Repeat - Electrical


Electrical noise or cross talk can have a significant negative effect to both Non Repeat and Accuracy when using any conventional LVDT or Half Bridge Gauging Probe.



Noise levels are often related to the number of probes installed and can have a significant effect on gauge R&R.
 
Solartron Metrology takes special care to ensure that with its shielded construction, its Analogue Probes are as immune as possible to external electrical interference. However, as a component no LVDT or Half Bridge Gauging Probe can, on its own, obtain CE certification for noise immunity or emission.
It is the responsibility of the system builder to obtain CE ertification for any complete system that incorporates Analogue Gauging probes.

Solartron Metrology’s Orbit Network and Digital Probes provide improved Gauge R&R through cleaner signals and better electrical noise immunity:

Solartron Digital Probes Conform to EN 61000-6-2 and have been independently approved for CE certification.








 

               
 
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